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Resin Material Thermal Resistance Measurement Device [Effective for Semiconductor Heat Dissipation Design!]

Effective for semiconductor heat dissipation design! A measuring device for measuring the thermal resistance of resin materials! Accurately measures thermal resistance under conditions close to those in which the resin is actually used!

The "resin material thermal resistance measurement device" is an apparatus for measuring the thermal resistance of resin materials, which is effective for heat dissipation design in semiconductors. 【Features】 ■ Using a steady-state method, it can measure the thermal resistance of resin, including contact thermal resistance, with high precision under conditions close to those in which the resin is actually used. (Measurement example: For silicon nitride with dimensions of 10 mm square and a thickness of 2 mm, the measurement accuracy is ±0.03°C/W) ■ Depending on the form of resin used, you can choose between constant load mode and constant thickness mode. (Measurement example: For thermosetting resin materials, measurements can be taken in constant load mode, while gel-like or grease-like resin materials can be measured in constant thickness mode.) *For more details, please request documentation or view the PDF data available for download.

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Thermal resistance tester

The transient thermal resistance tester is a device that measures the transient thermal resistance of IGBT, MOS-FET, diode, BJT, etc.

The BJT transient thermal resistance measurement device applies a specified power between the collector and emitter, raises the chip temperature, and measures the difference in base-emitter voltage (ΔVBE) using the small currents (Im) before and after. This allows for the estimation of the thermal resistance of the sample. The IGBT transient thermal resistance measurement device, similar to the BJT transient thermal resistance measurement device, measures the voltage difference between the gate and emitter (ΔVGE). The P-MOS FET transient thermal resistance measurement device, like the BJT transient thermal resistance measurement device, measures the voltage difference between the gate and source (ΔVGS). The BJT transient thermal resistance measurement device can measure the ΔVF of the diode between the base and emitter.

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